Jeff Gust, USA (FLUKE Chief Corporate Metrologist, Chairperson of ILAC Laboratory Committee Past President, member of the NCSLi Executive and VP for Outreach)
Jeff Gust is the Chief Corporate Metrologist for Fluke. Since joining in 2010, he has driven improvements in measurement quality for engineering, manufacturing and service activities for Fluke and Fortive organizations around the world. He is the Chair of the Laboratory Committee for the International Laboratory Accreditation Cooperation, served as President of NCSL International and was a member of the working group for the revision of ISO/IEC 17025. In 2011 Jeff was recognized by the Measurement Science Conference for outstanding contributions and leadership in metrology, and in 2017 was named a Fluke Fellow, the highest technical award for the company. Prior to joining Fluke, Jeff has co-authored publications with NIST and served as a consultant to NIST and UNIDO. Jeff has a bachelor’s degree from Purdue University in physics.
LECTURE: Challenges and Opportunities for Calibration Laboratories 2020 to 2050
There are many technological advances afoot that will change both the types of instruments that calibration laboratories service and the way that they will perform calibration. As Industry 4.0 is embraced by manufacturers, it will drive the installation of numerous sensors into many processes. New models for ensuring metrological traceability will have to be developed, and some of the calibrations will be performed with intrinsic standards that can directly realize the SI, so they won’t require re-calibration. This presentation will illustrate what the future may look like and proposes some possible solutions to address these challenges.